Sort by
Refine Your Search
-
Listed
-
Country
-
Field
-
Laboratory (https://amcl.udel.edu/ ), a shared core facility equipped with a Thermo Fisher iCAP TQ ICP-MS with laser ablation and chromatography capabilities, and a suite of X-ray diffraction and fluorescence
-
to future nano-electronics and nano-spintronics applications, particularly, focus on topological materials, Dirac materials, 2D van der Waals materials, correlated systems, and high-Tc superconductors
-
organic pollutants. This would require knowledge in the design and synthesis of porous frameworks, particularly in techniques such as Schlenk line, glove box, powder X-ray diffraction, electron diffraction
-
. Preferred Qualifications Ph.D. preferred. Hands‐on experience with Scanning Electron Microscopy (SEM) preferred. Equipment Utilized Position regularly uses X-Ray Diffraction (XRD); Scanning Electron
-
nanostructures for photonic integration in smart vision systems. In particular, he/she will be responsible for the theoretical study and development of codes and numerical models for computer simulation and design
-
: ultraviolet-visible spectroscopy, X-ray diffraction, scanning and transmission electron microscopy. Photoelectrochemical techniques: scan voltammetry, chronoamperometry in the dark and under illumination
-
scientific areas. Interuniversity Microelectronics Centre (IMEC), Leuven, Belgium The IMEC (https://www.imec-int.com/en ) is a world-leading research and innovation development center for nanoelectronics and
-
thinking and good problem-solving skills. Merits Practical experience of cement-related processes is a merit. Furthermore, documented experience of various experimental techniques in X-ray diffraction
-
measurements, and X-ray diffraction. In-situ techniques such as thermogravimetric analysis and dilatometry will be applied, complemented by microstructural examination using electron probe microanalysis. Master
-
-element simulations; and experience in the development of hardware and software for the control and data acquisition of negative thermal expansion measurements (e.g., X-ray diffraction and/or strain as a