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Field
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crystallography, specifically in the structure solution and refinement of small molecule crystals using either electron or X-ray diffraction techniques. While candidates with experience in structure analysis based
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time-resolved hard X-ray diffraction microscopy and spectroscopy on single-crystalline bulk and thin film quantum materials (e.g. ferroelectrics, multiferroics, strongly correlated electron systems
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techniques and electron diffraction methods \[MR1\] is essential for the role, and candidates should make their relevant experience for materials discovery clear in their application. The post is available
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, particularly in techniques such as Schlenk line, glove box, powder X-ray diffraction, electron diffraction, electron microscopy, and porosity analysis. The candidate is expected to have a thorough understanding
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of dislocation stress fields (in collaboration with CEA Saclay). - Program the diffraction procedures to generate images comparable to Electron Channeling Contrast Imaging (ECCI) obtained using a Scanning Electron
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crystallography, specifically in the structure solution and refinement of small molecule crystals using either electron or X-ray diffraction techniques. While candidates with experience in structure analysis based
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designing, performing, and analyzing catalytic reactions. Experience in surface organometallic chemistry Experience in oxide synthesis and characterization (such as gas absorption and powder x-ray diffraction
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, such as: Laser diffraction Thermogravimetric analysis (TGA) Dynamic vapour sorption (DVS) Differential scanning calorimetry (DSC) X‑ray diffractometry (XRD) Scanning and transmission electron microscopy
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the electronic, magnetic, and optical properties of 2D materials at ultrafast timescales, which holds promises for developing new energy technologies. The candidate is responsible for conceiving, planning, and
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Postdoctoral researcher (M/F), synthesis of crystal phase heterostructures by Molecular Beam Epitaxy
outcomes. Molecular beam epitaxy (MBE) growth of GaAs nanowires on patterned Si/SiO₂ substrates. Structural analysis by electron microscopy (in situ TEM, electron diffraction, zone-axis indexing). Automated