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. Conventional experimental techniques such as dilatometry, optical and electron microscopy, electron backscatter diffraction and x-ray diffraction with Rietveld refinement are available at the lab and can be used
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of immunity to environmental influences. Conventional experimental techniques such as dilatometry, optical and electron microscopy, electron backscatter diffraction and x-ray diffraction with Rietveld
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measure the extent of silicon phase transformation and plasticity underneath a silicon micro-scratch, using electron backscatter diffraction or transmission Kikuchi diffraction on focused ion beam lift-outs
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simultaneous wave interactions, including reflections, diffractions, refraction, and turbulence-induced scattering. Such effects not only complicate noise prediction but also disrupt conventional approaches