Sort by
Refine Your Search
-
Listed
-
Category
-
Field
-
of dislocation stress fields (in collaboration with CEA Saclay). - Program the diffraction procedures to generate images comparable to Electron Channeling Contrast Imaging (ECCI) obtained using a Scanning Electron
-
dynamics, it is therefore necessary to correct aberrations over time to restore a diffraction-limited illumination beam. This will be achieved using an adaptive optics (AO) loop specially designed for in
-
Postdoctoral researcher (M/F), synthesis of crystal phase heterostructures by Molecular Beam Epitaxy
outcomes. Molecular beam epitaxy (MBE) growth of GaAs nanowires on patterned Si/SiO₂ substrates. Structural analysis by electron microscopy (in situ TEM, electron diffraction, zone-axis indexing). Automated
-
plasma-assisted CVD techniques; - Knowledge of characterization techniques: Raman spectroscopy, scanning electron microscopy, atomic force microscopy, X-ray diffraction, etc.; - Knowledge of vacuum
-
diffraction) for structural analysis. - ICP-MS for elemental composition. - SEM/EDX and TEM for morphology and element distribution. - TGA/DTA for thermal analysis and stability. - XPS for surface chemical
-
, including X-Ray diffraction, scanning electron microscope, atomic force microscopy Additional comments NA Website for additional job details https://emploi.cnrs.fr/Offres/CDD/UMR137-JULGRO0-024/Default.aspx
-
controlled atmosphere - master the usual characterisations of materials (X-ray diffraction, spectroscopies) - have knowledge of magnetism - fluency in English (oral and written comprehension and expression
-
main contributor to the In-situ X-ray diffraction experiments performed for studying the formation of new silicides using both large volume presses such as multi-anvil and Paris-Edinburgh Presses
-
deposition new types of ultra-thin magnetic films. The growth will be performed either by PLD or off-axis sputtering. structural characterizations including X-ray diffraction, reciprocal space mapping, AFM
-
characterization of C and SiC fibers - Training on bench use (in particular heating techniques by Joule effect, laser diffraction, infrared imaging, pyrometry, preparation of micrometric samples, ...) - Technical