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procedures. Equipment Utilized Schlenk glassware, glovebox usage and maintenance, particle size, thermal analysis, x-ray diffraction, and infrared spectroscopy instrumentation. Physical Demands and Work
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Experience with structure characterisation using microscopy and diffraction methods Desirable Application/interview Ability to work independently Essential Application/interview Evidence of presentation skill
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advanced structural characterization techniques (multidimensional NMR, X-ray diffraction, UV–Vis, IR and fluorescence spectroscopies), photoisomerization studies and pKa determination, together
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determined by rank and step at appointment. See the following table(s) for the current salary scale(s) for this position: https://www.ucop.edu/academic-personnel-programs/_files/2025-26/represented-july-2025
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measurements, and X-ray diffraction. In-situ techniques such as thermogravimetric analysis and dilatometry will be applied, complemented by microstructural examination using electron probe microanalysis. Master
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-element simulations; and experience in the development of hardware and software for the control and data acquisition of negative thermal expansion measurements (e.g., X-ray diffraction and/or strain as a
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thinking and good problem-solving skills. Merits Practical experience of cement-related processes is a merit. Furthermore, documented experience of various experimental techniques in X-ray diffraction
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dating sediments with optically-stimulated luminescence (OSL) dating and particle size analysis of samples using a laser diffraction particle size analyzer. Subsample sediment and soil cores for analysis
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. The applications and the evidence of eligibility under the terms and conditions of the Call should be sent exclusively via the following weblink: https://posao.pmf.hr/opening-login?openingUUID=6f2b57e1-7220-489a
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Commissariat à l'Energie Atomique et aux Energies Alternatives - Groupe | Gif sur Yvette, le de France | France | 2 months ago
techniques including synchrotron radiation induced Hard X-ray photoelectron spectroscopy and complementary structural analysis including high-resolution electron microscopy, X-ray diffraction and near field