Sort by
Refine Your Search
-
. Conventional experimental techniques such as dilatometry, optical and electron microscopy, electron backscatter diffraction and x-ray diffraction with Rietveld refinement are available at the lab and can be used
-
metasurface pixels are patches filled with 2D arrays of scatterers (‘meta-atoms’) precisely tailored for diffractive outcoupling and wavefront shaping at the same time. Each metasurface pixel receives light
-
techniques, including X-ray diffraction, XPS, SEM-EDX, and in situ Raman and IR during electrocatalytic experiments. The performance of the selected materials will be investigated in the lab and in a pilot
-
measure the extent of silicon phase transformation and plasticity underneath a silicon micro-scratch, using electron backscatter diffraction or transmission Kikuchi diffraction on focused ion beam lift-outs
-
, additional material characterisation with techniques such as X-ray diffraction, X-ray and neutron reflectometry and X-ray photoemesion spectroscopy will be used to provide a fundamental understanding of the
-
simultaneous wave interactions, including reflections, diffractions, refraction, and turbulence-induced scattering. Such effects not only complicate noise prediction but also disrupt conventional approaches