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Diffraction (XRD) and Rietveld refinement for phase analysis. Electron microscopy (SEM, TEM, EDS) for morphology and elemental distribution. Spectroscopic techniques (XPS, Raman, FTIR) for surface chemistry
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hydrothermal methods. Structural and Chemical Characterization using: X-ray Powder Diffraction (XRD) and Rietveld refinement for phase analysis. Electron microscopy (SEM, TEM, EDS) for morphology and elemental
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. Advanced data interpretation using electron diffraction, dendritic growth modeling, and REE behavior in Fe-rich matrices. Competences & Personal Qualities Excellent English communication skills (oral and
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and thickness. Perform comprehensive characterization of perovskite thin films using techniques such as X-ray diffraction (XRD), scanning electron microscopy (SEM), atomic force microscopy (AFM), and UV
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: PhD degree in Materials Science, Chemistry, Crystallography Knowledge in crystallization technics Expertise in solving crystal structure using single-crystal X-ray diffraction data. Experience in
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coefficient modeling. Experience in integrating modeling with leaching and separation processes for scale-up. Advanced data interpretation using electron diffraction, dendritic growth modeling, and REE behavior
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techniques such as X-ray diffraction (XRD), scanning electron microscopy (SEM), atomic force microscopy (AFM), and UV-vis spectroscopy to study their structural, optical, and electronic properties. Fabricate