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of Operating Microelectronic Devices by X-ray Diffraction Microscopy Beamline ID01, at the ESRF is a world leading instrument dedicated to micro- and nano-beam X-ray diffraction imaging experiments. It enables
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several real-time growth monitoring tools: RHEED (reflection high-energy electron diffraction), ellipsometry, wafer curvature measurements⁶, and an optical flux measurement system⁷. These tools are now
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participate at all the experimental steps required for obtaining giant optical nonlinearities. This procedure includes thin film deposition, annealing, X-Ray Diffraction studies (XRD), Scanning Electron
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