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several real-time growth monitoring tools: RHEED (reflection high-energy electron diffraction), ellipsometry, wafer curvature measurements⁶, and an optical flux measurement system⁷. These tools are now
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.8b07216 [8] Dahlia Saad, PhD from Ecole Centrale de Lyon, “What happens at the nanometric scale at the liquid/solid interface? Implementation of an Atomic Force Microscope for 3D-AFM imaging of liquid/solid
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