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- MOHAMMED VI POLYTECHNIC UNIVERSITY
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specifically to XRD-PDF (pair distribution function). The project is linked to crystalline and amorphous alloys, and in an industrial context to process design by establishing the structure-property relationship
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• Experience in characterization of functional oxide thin films, including diffraction techniques (XRD, XRR, RSM), electron microscopy (SEM, EDX and TEM), Atomic Force Microscopy (AFM), X-ray photoelectron
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-DSC, MS) will be used to understand the mechanisms and selectivity by identifying reaction intermediates. The synthesized materials will be characterized by X-ray diffraction (XRD), FTIR, Raman
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the ability to provide quality research through various analytical methods and instrumentations. The Department is equipped with many state-of-the-art analytical instruments such as SEM, AFM, XRD, UV-Vis, Raman
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methods. Structural and Chemical Characterization using: X-ray Powder Diffraction (XRD) and Rietveld refinement for phase analysis. Electron microscopy (SEM, TEM, EDS) for morphology and elemental
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. Structural and Chemical Characterization using: X-ray Powder Diffraction (XRD) and Rietveld refinement for phase analysis. Electron microscopy (SEM, TEM, EDS) for morphology and elemental distribution
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equipment including clean rooms, several PVD chamber systems for thin film processing, high level of materials analysis facilities such as XRDs, SEMs, FIBs, TEM, APT; as well as in-situ micromechanical
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members on clay-related characterization (XRD, FTIR, SEM, TGA, and TEM). -Help with lab management: reporting, ordering, maintenance. Required Education -PhD in clay science or similar disciplines Preferred
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, XRD, XPS, and FTIR to study membrane structure and composition Analyze experimental data, maintain thorough documentation of research activities and results Disseminate findings through scientific
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of nanomaterials, including: Organic materials, MXenes, perovskites, nanotubes Self-assembled nanoparticles and thin films via layer-by-layer processing Characterization Techniques: HRTEM, STEM, XRD, XPS, Raman