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• Experience in characterization of functional oxide thin films, including diffraction techniques (XRD, XRR, RSM), electron microscopy (SEM, EDX and TEM), Atomic Force Microscopy (AFM), X-ray photoelectron
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-DSC, MS) will be used to understand the mechanisms and selectivity by identifying reaction intermediates. The synthesized materials will be characterized by X-ray diffraction (XRD), FTIR, Raman
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anions. Potentially, surface analyses of Zero-valent Iron particles by XRD and SEM will complement the analyses. The results of the work should be subject to scientific publication (rank A journals). Where
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