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in a vibrant and multidisciplinary and multinational environment (E) Experience in X-ray diffraction/imaging/spectroscopy techniques preferably synchrotron based (D) Experience in raising key issues
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x-ray diffraction and materials research facilities and instrumentation in the Departments of Chemistry and Earth and Environmental Sciences (Departments), including, but not limited to, Single
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spectroscopy, powder X-ray diffraction and single-crystal X-ray diffraction. This project will commence with a synthetic laboratory component, where the Amgen Scholar will develop skills in air-free Schlenk line
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phonon states in a variety of engineered quantum systems. https://www.oist.jp/research/research-units/qmsu [Work content and job description] -Basic evaluation of substances and materials, including X-ray
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ceramic materials by electrospinning for application in ceramic electrochemical reactors; use of different characterization techniques, including impedance spectroscopy, thermogravimetry, dilatometry, X-ray
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fluorescence (XRF), x-ray diffraction (XRD), scanning electron microscopy (SEM), and isotope geochemistry Conducting analyses using ICP-MS, ICP-OES, XRF and colorimetric techniques in consultation with
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harmful microorganisms. You will actively work with the characterization of various materials using environmental electron microscopy, X-ray diffraction, AFM, and various spectroscopic methods such as NMR
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Institute of Low Temperature and Structure Research Polish Academy of Sciences | Poland | 29 days ago
durability under reaction conditions. To elucidate structure–activity relationships, the obtained materials will be in-depth characterized using advanced techniques, including powder X-ray diffraction
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Commissariat à l'Energie Atomique et aux Energies Alternatives - Groupe | Gif sur Yvette, le de France | France | about 2 months ago
techniques including synchrotron radiation induced Hard X-ray photoelectron spectroscopy and complementary structural analysis including high-resolution electron microscopy, X-ray diffraction and near field
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characterization techniques such as scanning electron microscopy (SEM, HRTEM), X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS) and chemisorption techniques (TPD, TPR) is needed. Your contribution