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crystallography, specifically in the structure solution and refinement of small molecule crystals using either electron or X-ray diffraction techniques. While candidates with experience in structure analysis based
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of their properties. The primary responsibilities include synthesizing Crystalline inorganic compound, their characterization with x-ray diffraction and spectroscopic methods, as well as analysis of their magnetic and
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pulsed laser deposition (PLD), atomic force microscopy (AFM), advanced X-ray diffraction (XRD), and transport measurements (Hall effect and magneto-transport at low temperature). For deeper insights
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radiation beamline hands-on experience in X?ray microscopy techniques, X?ray diffraction or X?ray fluorescence working knowledge of image processing e.g. using machine learning German skills For further
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fabrication. Receive individual trainings in state-of-the-art methodology, comprising pulsed laser deposition (PLD), atomic force microscopy (AFM), advanced X-ray diffraction (XRD), and transport measurements
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fabrication. Receive individual trainings to learn state-of-the-art methodologies, comprising pulsed laser deposition (PLD), atomic force microscopy (AFM), advanced X-ray diffraction (XRD), electrochemcial
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, including X-Ray diffraction, scanning electron microscope, atomic force microscopy Additional comments NA Website for additional job details https://emploi.cnrs.fr/Offres/CDD/UMR137-JULGRO0-024/Default.aspx
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and Technology (NTNU) for general criteria for the position. Preferred selection criteria Documented competence within X-ray imaging, diffraction or electron microscopy, preferably transmission
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-crystal X-ray diffraction), and mass spectrometry. Thermal behaviour will be assessed using differential scanning calorimetry (DSC) and thermogravimetric analysis (TGA), complemented by mass spectrometric
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deposition new types of ultra-thin magnetic films. The growth will be performed either by PLD or off-axis sputtering. structural characterizations including X-ray diffraction, reciprocal space mapping, AFM