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of Research ExperienceNone Research FieldTechnologyYears of Research ExperienceNone Additional Information Eligibility criteria PhD in Materials Science. Metallurgy, phase transformations, microscopy, X-Ray
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of the obtained materials using elemental analysis, nuclear magnetic resonance (RMN), ICP-OES, infrared spectroscopy (IR), ultrared-visible spectroscopy (UV-Vis) and Raman spectroscopy, X-ray diffraction, X-ray
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(JCNS-1) Project 3: Combined X-ray and neutron single-crystal high-pressure diffraction in diamond anvil cells (JCNS-2) Project 4: Experimental and numerical investigation of the heat flow generated by
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of Operating Microelectronic Devices by X-ray Diffraction Microscopy Beamline ID01, at the ESRF is a world leading instrument dedicated to micro- and nano-beam X-ray diffraction imaging experiments. It enables
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Coherent Diffraction Imaging (BCDI), ptychography, and X-ray Photon Correlation Spectroscopy (XPCS). The goal is to move beyond simple correlations to discover the causal, governing rules of defect-property
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properties. Surface characterization will be carried out using techniques such as optical microscopy, scanning electron microscopy (SEM), X-ray photoelectron spectroscopy (XPS), and X-ray diffraction (XRD
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PROJET-PEPR : MOF composites for the overall CO₂ reduction through panchromatic photocatalysis (M/F)
NMR, X-ray diffraction, EDX analysis, nitrogen adsorption isotherms, and ICP analyses available in the laboratory. Photocatalytic experiments under heterogeneous conditions will then be carried out in
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densified ceramics (density, particle size, X-ray diffraction, SEM and TEM microscopy, thermal analyses, etc.), the PhD student will seek to understand the physical properties of these materials, in
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fluorescence (XRF), x-ray diffraction (XRD), scanning electron microscopy (SEM), and isotope geochemistry Conducting analyses using ICP-MS, ICP-OES, XRF and colorimetric techniques in consultation with
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crystallography, specifically in the structure solution and refinement of small molecule crystals using either electron or X-ray diffraction techniques. While candidates with experience in structure analysis based