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of Operating Microelectronic Devices by X-ray Diffraction Microscopy Beamline ID01, at the ESRF is a world leading instrument dedicated to micro- and nano-beam X-ray diffraction imaging experiments. It enables
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for a Postdoctoral Fellow in lithographic fabrication of X-ray optics for microscopy and spectroscopy Your tasks Development of nano-fabrication processes for diffractive X-ray optical elements at PSI's
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diffraction and if possible, X-ray imaging. We expect the candidate's enthusiasm for interdisciplinary work related to Space sciences. The working place will be Dübendorf / Zurich. Postdoc in "Development and
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crystallography, specifically in the structure solution and refinement of small molecule crystals using either electron or X-ray diffraction techniques. While candidates with experience in structure analysis based
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partially ordered systems. Particular use is made of X-ray and neutron diffraction, cryo-EM, and a wide range of other biophysical techniques. The group is located in close proximity to the MAX-IV and ESS
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. Conventional experimental techniques such as dilatometry, optical and electron microscopy, electron backscatter diffraction and x-ray diffraction with Rietveld refinement are available at the lab and can be used
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of the most brilliant storage-ring-based X-ray sources for high-energy photons and coherence applications worldwide. It is operated at a particle energy of 6 GeV and is therefore especially suited to produce X
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radiation beamline hands-on experience in X?ray microscopy techniques, X?ray diffraction or X?ray fluorescence working knowledge of image processing e.g. using machine learning German skills For further
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of their properties. The primary responsibilities include synthesizing Crystalline inorganic compound, their characterization with x-ray diffraction and spectroscopic methods, as well as analysis of their magnetic and
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-crystals subjected to time-dependent electric fields. Uniaxial ferroelectrics grown by dedicated IKZ groups are available for this study. The work involves time- and field-dependent X-ray diffraction (XRD