-
14, 1–9 (2024). (2) Reischig, P. & Ludwig, W. Three-dimensional reconstruction of intragranular strain and orientation in poly-crystals by near-field X-ray diffraction. Curr. Opin. Solid State Mater
-
laser deposition (PLD); • Implementing partial and total reduction processes of the films, with or without capping layers; • Performing structural and electronic characterization using X-ray diffraction
-
of the studied assemblies by X-ray diffraction (XRD) and Raman spectroscopy. The experimental parameters obtained will serve as input data and will make it possible to calibrate the elementary electrochemical
-
-DSC, MS) will be used to understand the mechanisms and selectivity by identifying reaction intermediates. The synthesized materials will be characterized by X-ray diffraction (XRD), FTIR, Raman