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powder X-ray diffraction, SEM and electrochemical characterization techniques. General Requirements: very good university degree (M.Sc. or equivalent) in chemistry or materials sciences; specialization in
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laboratory PDF diffractometer, including the optimization of measurement protocols and combined mass spectrometry Experiments at synchrotron radiation facilities Analysis of powder X-ray diffraction (PXRD) and
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ways, mechanical properties test (such as tensile test, etc.) and some highly advanced microstructural characterisation such as SEM (Scanning electron microscope), XRD (X-ray diffraction) and TEM
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the design of fundamentally new alloys by computational methods; production through arc melting, powder metallurgy or additive manufacturing; characterisation using advanced electron microscopy and x-ray
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the design of fundamentally new alloys by computational methods; production through arc melting, powder metallurgy or additive manufacturing; characterisation using advanced electron microscopy and x-ray
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; EPSRC Centre for Doctoral Training in Green Industrial Futures | Bath, England | United Kingdom | 2 months ago
(MS) to study reaction and drying kinetics. X-ray Diffraction (XRD) for crystalline phase identification. Scanning Electron Microscopy (SEM-EDX) for microstructural and elemental analysis. Numerical and
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inviting applications for a PhD Student (f/m/x) for the project Theory and Algorithms for Structure Determination from Single Molecule X-Ray Scattering Images Project description Single molecule X-ray
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facilities, such as x-ray synchrotron light sources. This is an exciting opportunity to work with internationally recognised experts in the fields of neutron and x-ray scattering, high-temperature and glassy
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up and diversify synthetic routes to make broad libraries of natural compounds. Synthesized molecules will be identified and characterize by NMR, MS and single crystal X-ray diffraction (SC-XRD) – all
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optimal operating conditions and followed by surface analysis techniques (e.g. Scanning electron microscope, X-ray diffraction for residual stress measurements, Electron Back-Scattered Diffraction and