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(LEEM/PEEM) at the UE49PGM-SMART high flux soft x-ray beamline at BESSY-II. This spectro-microscope is used to characterize catalytically active surfaces such as single crystal surfaces, oxide films and
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. Conduct electrochemical characterization, including cyclic voltammetry, galvanostatic charge/discharge, and electrochemical impedance spectroscopy. Perform material characterization (X-ray diffraction
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