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• Experience in characterization of functional oxide thin films, including diffraction techniques (XRD, XRR, RSM), electron microscopy (SEM, EDX and TEM), Atomic Force Microscopy (AFM), X-ray photoelectron
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techniques at the nuclear microprobe (CEA IRAMIS) and neutrons/X-Ray imaging techniques at synchrotron/neutrons facilities (CEA IRIG). The postdoctoral associate will be responsible for testing
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various methods, including X-ray diffraction, IR spectroscopy, and electron microscopy. He/she may also be required to participate in their electrochemical characterization. He/she will also be expected
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-DSC, MS) will be used to understand the mechanisms and selectivity by identifying reaction intermediates. The synthesized materials will be characterized by X-ray diffraction (XRD), FTIR, Raman