Sort by
Refine Your Search
-
Listed
-
Category
-
Country
-
Program
-
Field
-
for electrocatalysis or lithium insertion. Structural investigation will allow us to determine average crystal structure with use of X-ray diffraction (powder or single crystal), small-angle scattering to determine
-
-L, 100%) The position is for two years. The research group of Prof. Dr. Dr. h.c. Frank Schreiber at the University of Tübingen is working on the physics of molecular and biological matter using X-ray
-
X-ray Science. AMBER is funded by the EU Marie Skłodowska-Curie (MSCA) COFUND scheme. Around 15 postdocs will be recruited in the fifth call 2026, with each fellowship lasting 36 months. AMBER has six
-
wide range of proteins and perform X-ray crystallography and structure determination of resulting protein crystals. The fellowship is externally funded for 2 years. You will have completed a PhD in
-
matter using X-ray and neutron scattering for structure and dynamics of these systems. For more information, see www.soft-matter.uni-tuebingen.de . Currently we are looking for a post-doctoral researcher
-
biological matter using X-ray and neutron scattering. The main research areas are materials for photovoltaics, proteins in solutions and at the interfaces, complex nano-structured materials and machine
-
approaches, including: •cryo-electron microscopy (cryo-EM), •X-ray crystallography, • biophysical analyses of protein–DNA interactions (EMSA, ITC, BLI, HeliX). This is a fundamental research project — focused
-
, for which full training will be provided Familiarity with single crystal X-ray diffraction techniques is a necessity with experience of non-standard experimental design including extreme conditions a strong
-
. Perform particle selection, classification, and structure refinement to determine and finalize coordinate structures. Conduct crystallization screening, crystal optimization, X-ray diffraction data
-
composition – The composition and chemical speciation of the films will be analyzed by X-ray photoelectron spectroscopy (XPS), complemented by scanning electron microscopy (SEM). Surface infrared measurements