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Electron Microscopy (TEM) and HAADF-STEM images. Microscopy data are often degraded by noise and scan distortions, and clean ground truth data are rarely available. This project aims to go beyond standard
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electronic doping to control and modify their electronic characteristics. The project’s goal is to develop fundamental understanding and innovative fabrication processes to solve urgent problems in organic
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level in electrical engineering, electromagnetic engineering, wireless engineering, engineering physics, applied physics, a closely related field. Good command of electromagnetic simulation tools such as
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