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and membranes. Preparing samples from vdW single crystals (thin layers, membranes, and heterostructures). Characterizing samples using Brillouin and Raman light-scattering techniques as well as SEM, TEM
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cooperation partners in their research projects with state-of-the-art light and electron microscopes (https://www.leibniz-fmp.de/cellular-imaging ). We work with proteins, cell cultures, and model organisms
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-electron microscopy–based approaches. More information about the laboratory can be found at: https://www.cryo-em.psu.edu/ . The postdoctoral scholar will contribute to ongoing projects to define structural
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ultrafast SEM/TEM, time-resolved electron microscopy, cathodoluminescence Hands-on experience with complex instrumentation, including vacuum systems, ultrafast lasers, cryogenic environments Experience with
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Quantum Materials and Devices – Deng Research Group Prof. Bingchen Deng (https://luddy.indiana.edu/contact/profile/index.html?bingchen_deng) in the Department of Intelligent Systems Engineering at Indiana
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of the printed layers using profilometry, SEM and AFM to ensure optical quality and adhesion. Leading the production of smart window modules. Where to apply Website https://seuelectronica.upc.edu/en/procedures
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at the 'Group of Smart Nanoengineered Materials, Nanomechanics and Nanomagnetism -Gnm3' (https://jsort-icrea.uab.cat/) of the Universitat Autònoma de Barcelona (UAB). The position is in the framework
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SD-26045-RESEARCHER IN ADVANCED PLASMA-ASSISTED DEPOSITION PROCESS DEVELOPMENT FOR CATALYTIC THIN...
in their decisions and businesses in their strategies. Do you want to know more about LIST? Check our website: https://www.list.lu/ How will you contribute? In the framework of a bilateral project
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of data scientists, software engineers, and experimental researchers on topics including: Developing multi-scale and multi-modal representation learning methods for scientific imaging data (e.g., SEM
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or burn-resistant testing demonstrated experience with conducting microstructural characterization techniques such as SEM, TEM, XRD, EDS, EBSD, FIB/SEM etc., as well as physico-mechanical characterization