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Development of a Low-Voltage Multi-Beam SEM for High-Throughput Imaging | TU Delft Job description Scanning Electron Microscopy (SEM) plays a central role in today’s nanoscale imaging across both science and
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., NMR, FTIR, GC–MS, HPLC, BET, SEM/TEM). Knowledge of techno-economic analysis (TEA) or life cycle assessment (LCA) of biomass-derived products. Strong writing skills and prior experience in proposal
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techniques, such as particle size and shape, powder flow assessment, advanced electron beam microstructural characterisation techniques and sample preparation for powders (e.g. cryo-SEM, FIB and/or TEM) and X
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) microscopy, electron microscopy (SEM/TEM), NMR spectroscopy, and optical spectroscopy, sol-gel synthesis and bioinspired mineralization methods, data analysis, scientific communication, and collaboration
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an experimental platform comprising state-of-the-art characterization technologies (FEG-SEM Zeiss Mineralogic, core scanners, online characterization tools – 3D, hyperspectral, VNIR, SWIR, XRT, XRF, LIBS) as
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, with opportunities to publish, contribute to proposals, and gain experience in laboratory and project management. For more information, please visit: https://nmfc.me.vt.edu/. Required Qualifications
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, sponsored content, video, blog, event, and email journey communication campaigns Develop messaging for all advertising channels, including SEM campaigns, enrollment marketing messaging, and external facing
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. (Required) Experienced with GC, SEM, XRF analytical analysis. (Required) Experience with electrochemical systems and voltametric analysis. (Required) Experience with molten metal chemical reactors for methane
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experimental techniques relevant to surface engineering, surface characterization (e.g., XPS, AFM, SEM, Raman spectroscopy, Hardness, scratch, friction, and roughness testing), thin film materials synthesis and
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. Have a good knowledge of analytical techniques (GC/LC-MS, HPLC, etc), spectroscopic techniques (UV-Vis, FTIR, Raman, NMR, XRD, spectrophotometry, etc), and microscopy techniques (SEM, TEM, AFM, etc