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Experience as a researcher or in industry is a plus Hands on experience with any of the following is an advantage: SEM, TEM, XRD, FTIR, TGA, DSC, NMR; Deep eutectic solvents; Plaster materials; Building
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mechanisms. Conduct materials and interfacial characterization using appropriate techniques (e.g., XRD, SEM/TEM, XPS, Raman/FTIR, DSC/TGA), and correlate structure–property–performance relationships. Develop
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-driven micromagnetic computational simulations. Extending MERRILL with a data-driven workflow that incorporates constraints from Quantum Scanning Microscope and slice-and-view FIB-SEM measurements
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particle geometry in three dimensions using slice-and-view FIB-SEM analysis. Determining mineralogical and chemical properties (composition, zoning, crystallographic orientation) using complementary electron
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/ EEA countries and exemptions from the requirements: https://www.mn.uio.no/english/research/phd/regulations/regulations.html#toc8 Grade requirements: The norm is as follows: The average grade point
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Institute of Low Temperature and Structure Research Polish Academy of Sciences | Poland | 19 days ago
hydrogenation, smart nanomaterials, thermally-programmed methods, electron microscopy (TEM, SEM), in situ/operando methods Description of the research project and the PhD thesis Supervisor: prof. dr hab. Leszek
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The University of North Carolina at Greensboro | Greensboro, North Carolina | United States | about 2 months ago
science-related field with extensive hands-on experience in electron microscopy (HR-TEM and SEM). Having exposure to microbiology research, working with bacteria, and interfacing live microbes with abiotic
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stereolithographic 3D printing techniques and characterization of carbon materials, namely by thermogravimetry, SEM, TEM, Raman, elemental analysis, among other relevant techniques; 4) Possess experience in
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advanced multi-scale characterisation techniques (XRD, transmitted light petrography, SEM/EDS, X-ray tomography, FIB-SEM/TEM, petrophysical measurements, gas chromatography and fluid chemistry analysis), and
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maintains shared instrumentation for scanning electron microscopy (SEM), scanning probe / atomic force microscopy, optical microscopy / metrology, optical spectroscopy, elemental analysis, digital fabrication