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methods (XPS, UPS, AFM, SEM). Daily tasks: Growth by MBE of materials and structures from the III-N semiconductor group Characterization of grown materials and structures by surface methods (XPS, UPS, AFM
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Institute of Low Temperature and Structure Research Polish Academy of Sciences | Poland | 3 days ago
, hierarchical catalysts, carbon dioxide hydrogenation, smart nanomaterials, thermally-programmed methods, electron microscopy (TEM, SEM), in situ/operando methods Where to apply E-mail wsdipan@intibs.pl
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