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acquisition techniques are combined to extract nanoscale dimensional information well below conventional diffraction limits. These measurements are optimized by tailoring the illumination so as to yield
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force microscopy (AFM) with IR spectroscopy thus enabling IR analysis with a spatial resolution 5-10 nm (i.e. well below the diffraction limit of IR light). This enables determining chemical composition
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also have familiarity with X-ray Diffraction and Pair Distribution Function anaylisis, experience with data acquisition using the Bluesky experiment orchestration package, and knowledge of beamline
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