143 structures-"https:"-"https:"-"https:"-"https:"-"https:"-"https:"-"CEA-Saclay" positions at NIST
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structure, crystallographic phase, grain structure, crystallographic texture, crystal defects, lattice strain, contaminants • Imaging of 3D assemblies of 2D materials: moving toward characterization in
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. Such “next generation” devices will depend on new materials and innovative device structures. Thin-film PV devices, also called second generation devices, are becoming competitive with Si-based technologies
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based on a planar lipid bilayer architecture to complement neutron scattering studies on peripheral membrane protein structure. The first, bilayer overtone analysis, involves measurement of the electric
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, Materials and Structural Systems Division opportunity location 50.73.11.C1032 Gaithersburg, MD NIST only participates in the February and August reviews. Advisers name email phone Stephanie J. Watson
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microscopy and spectroscopy (STM/STS), and atomic force microscopy (AFM). Topics of interest include (1) energy level spectroscopy of quantum confined structures and two-dimensional electron systems, including
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are encouraged to submit research proposals on the following topics: DFT and MD for computational dielectric spectroscopy Properties of electrochemical double layer (effects on the local polarization, structure
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the mechanical properties of polymer thin films change under confinement. We are applying a wrinkling-based metrology to elucidate the mechanical response of confined and/or structured polymer films. Of interest
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these issues. On-wafer measurements of thin-film devices allows us to measure the impedance of planar thin-film-based structures at frequencies up to 100 GHz. When combined with more traditional impedance
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collaborators from academic institutions, professional societies (ISMRM, RSNA), and possibly other federal agencies to develop the calibration structures and quantitative imaging protocols. MRI; Biomedical
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, heterogeneous metastable microstructures, and nonequilibrium phases. These challenges make it difficult to establish the critical structure-process-performance relationships required for qualification and