390 structural-engineering "https:" "https:" "https:" "https:" "https:" "UCL" "UCL" "UCL" "UCL" "UCL" positions at NIST
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RAP opportunity at National Institute of Standards and Technology NIST Determination of Structural Ensembles Describing Conformational Averaging in Proteins and RNA from Solution NMR and X-ray
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quantitative CR-PFM to novel materials and device structures, such as piezoelectric devices for energy harvesting and nano-generation, or lithium ion battery materials for improved power generation and charging
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RAP opportunity at National Institute of Standards and Technology NIST Long-Term Performance of Textiles, Nanocomposites, and High Strength Fibers Location Material Measurement Laboratory
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RAP opportunity at National Institute of Standards and Technology NIST Full-Scale Testing of Structural Concrete at the National Fire Research Laboratory Location Engineering Laboratory, Fire
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RAP opportunity at National Institute of Standards and Technology NIST Experimental studies of quantum anomalous Hall effect devices Location Physical Measurement Laboratory, Nanoscale Device
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Research." Metabolites 9(7). 3 - https://doi.org/10.6028/NIST.IR.8451 Researchers: Aaron Urbas (aaron.urbas@nist.gov ), Sandra Da Silva (sandra.dasilva@nist.gov ), Ben Place (benjamin.place@nist.gov ) and
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2023, DOI:10.3389/fmicb.2023.1133773 [2] W. Johnson, D. C. France, T. L. Kirschling, & F. L. Walls, “Resonator and process for performing biological assay,” U.S Patent US 9,725,752 B2 [2017]. https
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RAP opportunity at National Institute of Standards and Technology NIST Engineering Enzymes for the Biomanufacture of Nucleoside Conjugates Location Material Measurement Laboratory, Biomolecular
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NIST only participates in the February and August reviews. There is a growing need for high-performance materials for various technological applications. To address this need, the NIST-JARVIS (https
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RAP opportunity at National Institute of Standards and Technology NIST Atomic Scale Characterization and Manipulation Location Physical Measurement Laboratory, Nanoscale Device Characterization