Sort by
Refine Your Search
-
. In this project, we are developing metrology needed for the synthesis, processing, and characterization of low-dimensional materials to enable reliable nanoscale device development and manufacturing
-
Tytus Dehinn Mui Mak tytus.mak@nist.gov 202.360.6799 Description In the past decade, the rapid pace of development in mass spectrometry technologies has accelerated the rise of metabolomics and resulted
-
@nist.gov 301.975.2860 Description New developments in detector technology have made possible the acquisition of the full electron scattering distribution at each pixel in a scanning transmission electron
-
are not sufficiently accurate, or the methods are too expensive to accurately model sufficiently large systems. As a result, these computational problems are ideal for developing machine-learned potentials
-
parameter space challenging due to the sheer number of possible compositions. To enable rational design of these materials, we have developed a highly adaptable sample environment that can be programmed
-
This research focuses on developing new applications of high resolution/accurate mass (HRAM) mass spectrometry for environmental, forensic, and nutritional analyses. HRAM mass spectrometry instrumentation has
-
the “NIST-on-a-chip” program, we are designing and building chip-scale accelerometers as field-deployable SI-traceable standards. The accelerometers employ a micromechanical structure in conjunction with a
-
on the science that will underpin the development of the needed metrology to close this gap. The ideal candidates would have some understanding of high frequency electrical characterization, as well as substantial
-
identification purposes has been applied in the field of forensic science for over 20 years. NIST develops standards and genetic tests to support the forensic science community. Areas of interest include typing
-
in biomanufacturing and personalized medicine. We are developing new electronics techniques that leverage the field effect, and optomechanical interferometric methods for the on-chip measurements