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) investigating the use of immersive visualization as a scientific instrument for exploration and representation of data; (2) developing interactive measurement techniques on visualizations; (3) developing ways
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Description Our group is developing chip-scale nonlinear optical devices based on dispersion engineered waveguides in a variety of materials including silicon, silicon nitride, and AlGaAs. A major thrust for
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Description Euv lithography has become a primary manufacturing tool for the semiconductor industry, but new challenges in the development and characterization of EUV resists have emerged as the technology
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to predict materials properties is essential to improve materials design methods. This research will focus on the development and integration of first principle calculations; atomistic simulations; and/or
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properly integrating the various components. Measurement needs now being defined by the energy, homeland security, environmental, and health-care sectors are challenging sensor-science researchers to develop
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Michael Pettibone john.pettibone@nist.gov 301.975.5656 Description Detection, characterization and temporal evolution of metal nanoparticles is undergoing environmental transformations. Within
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topics include 1) the development of measurement methods and techniques to collect, sample, and characterize release material from nanocomposites under various use scenarios to aid downstream hazard
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(1) development of nanoscale characterization techniques to measure mechanical, chemical, and rheological properties of microscopic volume elements with nanoscale spatial resolution using atomic force
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cell is alive or dead, is a critical and challenging measurement. Our goal is to develop advanced methods for rapidly, accurately and quantitatively measuring the viability of mixed microbial populations
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measurement traceability to the SI (unit Bq) by expanding on traditional gas counting capabilities and developing new methods to meet outstanding challenges. In particular, we seek to develop absolute assay