353 structural-engineering-"https:"-"https:"-"https:"-"https:"-"https:"-"https:"-"Dip" positions at NIST
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Causal Green’s Function for Modeling of Phonon Transport in Nanoscale Semiconductors: Application to Devices for Thermal Management and Energy Applications NIST only participates in the February and August reviews. Efficient thermoelectric and thermal management devices consist of complex...
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RAP opportunity at National Institute of Standards and Technology NIST Block Copolymer Lithography Location Material Measurement Laboratory, Materials Science and Engineering Division
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RAP opportunity at National Institute of Standards and Technology NIST Atom-based Solid-state Quantum Devices and Simulators Location Physical Measurement Laboratory, Quantum Measurement
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-to illuminate the structural transformations that occur across phases. The optical characterization of biological molecules using vibrational spectroscopy supplies critical, detailed structural information
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RAP opportunity at National Institute of Standards and Technology NIST High Rate Mechanical Properties of Materials Location Material Measurement Laboratory, Materials Science and Engineering
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RAP opportunity at National Institute of Standards and Technology NIST Dielectric and Rheological Characterization of Chiral Cellulose Nanocrystal Polymer Composites Location Material
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RAP opportunity at National Institute of Standards and Technology NIST Nanomagnetism-Dynamics Location Physical Measurement Laboratory, Nanoscale Device Characterization Division opportunity
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RAP opportunity at National Institute of Standards and Technology NIST Durability of fiber-reinforced polymer composite retrofits used in buildings and infrastructure Location Engineering
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RAP opportunity at National Institute of Standards and Technology NIST Applied Optimization and Simulation Location Information Technology Laboratory, Applied and Computational Mathematics
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RAP opportunity at National Institute of Standards and Technology NIST Advanced Imaging and Mechanical Characterization of Polymer Matrix Composite Interfaces Location Material Measurement