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these issues. On-wafer measurements of thin-film devices allows us to measure the impedance of planar thin-film-based structures at frequencies up to 100 GHz. When combined with more traditional impedance
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RAP opportunity at National Institute of Standards and Technology NIST Metrology for Semiconductor Manufacturing Location Physical Measurement Laboratory, Sensor Science Division opportunity
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RAP opportunity at National Institute of Standards and Technology NIST Mechanical Behavior of Organ-on-Chip Location Material Measurement Laboratory, Materials Science and Engineering Division
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RAP opportunity at National Institute of Standards and Technology NIST Decay Energy Spectrometry (DES) Using Transition Edge Sensors (TES) For Measuring Absolute Activity of Radionuclides
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RAP opportunity at National Institute of Standards and Technology NIST Inkjet fabrication of phantoms for autoradiography and medical imaging Location Physical Measurement Laboratory, Radiation
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RAP opportunity at National Institute of Standards and Technology NIST Microfluidics for Biotherapeutics Measurements Location Material Measurement Laboratory, Biomolecular Measurement Division
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RAP opportunity at National Institute of Standards and Technology NIST Cryptography Through the Lens of Quantum Information Science Location Information Technology Laboratory, Computer Security
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RAP opportunity at National Institute of Standards and Technology NIST Conductivity and Resistivity of Materials Location Physical Measurement Laboratory, Quantum Measurement Division
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RAP opportunity at National Institute of Standards and Technology NIST Large Eddy Simulation of Fires and Combustion Systems Location Engineering Laboratory, Fire Research Division opportunity
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RAP opportunity at National Institute of Standards and Technology NIST Development of Technologies to Enable Single Molecule Protein Sequencing Location Material Measurement Laboratory