191 structures "https:" "https:" "https:" "https:" "Lawrence Berkeley National Laboratory Physics" positions at NIST
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shown that these structures are almost purely radiatively broadened at 9 K. We are soliciting proposals to extend this experimental method to investigate multi-exciton and charged exciton complexes. We
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property data primarily intended for model development that investigate how the molecular size, molecular structure, and polarity of fuel constituents impacts their thermophysical properties. Measurements
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and computational models. key words additive manufacturing; phase transformations; processing-structure-property relations; metals; computational modeling; Eligibility citizenship Open to U.S. citizens
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for the high-throughput simulation of adsorption isotherms in nanoporous solids. References Cockayne E, Wong-Ng W, Chen YS, Culp JT, Allen AJ: Density Functional Theory Study of the Structure of the Pillared
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force fields and probabilistic multiscale/multiphysics surrogate modeling. Preferred areas of application include structure and microstructure of metallic alloys and relationships between defects and
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transformations produced by metabolically active microbes. Microbial abundances and growth rates (fitness), determined using NGS, allow predictions of changes to community structure over time. While
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measurements are used to monitor these surface and interfacial processes. A primary objective of our research involves characterizing surface and/or molecular chemical and structural characteristics under
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diagnostics of plasmas with an x-ray free electron laser. key words Atomic spectroscopy; Atomic structure; Highly-charged ions; Collisional-radiative modeling; Atomic collisions; Plasma spectroscopy; Atomic
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surfaces take advantage of the increased electrical functionality, chemical and structural robustness, wealth of fabrication knowledge, and present a less disruptive technology compared with monolayers
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of integration. We are developing advanced electronic, thermal, and mechanical measurements to evaluate the performance, reliability, and security of advanced microelectronic structures. Experimental techniques