361 engineering-computation-"https:"-"https:"-"https:"-"https:"-"UCL" positions at NIST
Sort by
Refine Your Search
-
RAP opportunity at National Institute of Standards and Technology NIST Decay Energy Spectrometry (DES) Using Transition Edge Sensors (TES) For Measuring Absolute Activity of Radionuclides
-
RAP opportunity at National Institute of Standards and Technology NIST Mathematical Modeling of Magnetic Systems Location Information Technology Laboratory, Applied and Computational Mathematics
-
for achieving recovery-based objectives, (3) computing the collapse risk of new and existing buildings and infrastructure systems, (3) developing improved nonlinear modeling capabilities to evaluate the response
-
RAP opportunity at National Institute of Standards and Technology NIST Advancing Forensic Seized Drug Analysis Location Material Measurement Laboratory, Materials Measurement Science Division
-
RAP opportunity at National Institute of Standards and Technology NIST Microfluidics and Lab-on-a-Chip Technologies for Controlled Molecular Self-Assembly, Analytical Biochemistry, and
-
attracted considerable attention for potential application in nanoscale devices, including beyond-CMOS electronics, quantum computers, chemical sensors, photodetectors, etc. Prospective advantages over
-
NIST only participates in the February and August reviews. This program involves multimodal imaging techniques that use magnetic resonance imaging (MRI) as either a base or as a complimentary
-
Mode Diagnostic Capabilities for Integrated Circuit Reliability Analyses. ECS Journal of Solid State Science and Technology 4(1) SI: N3113-N3117, 2015 Okoro CA, et al: A Detailed Failure Analysis
-
RAP opportunity at National Institute of Standards and Technology NIST Enabling Advanced Functionalities in Photonics using Low-Dimensional Semiconductors Location Material Measurement
-
-process densification. Complementary computational model simulation capabilities are also available. [1] J. Ilavsky, F. Zhang, R.N. Andrews, I. Kuzmenko, P.R. Jemian, L.E. Levine & A.J. Allen; J. Appl