286 coding-"https:"-"Prof"-"FEMTO-ST" "https:" "https:" "https:" "https:" "U.S" "St" positions at NIST

Microwave Materials for High-Speed Microelectronics

NIST | Boulder, Colorado | United States | about 7 hours ago

; Data informatics; Physics; Terahertz; Metrology; Eligibility citizenship Open to U.S. citizens level Open to Postdoctoral applicants Stipend Base Stipend Travel Allotment Supplementation $82,764.00

Graphene Metrology for New Intrinsic Quantum Electrical Standards and Device Technologies

NIST | Gaithersburg, Maryland | United States | 1 day ago

of multiscale methods to measure how the marcoscopic behavior of novel graphene devices arises from the microscopic distribution of nanoscale properties involves multiple NIST research efforts linking STM, STS

Microsystems for Massively Multiplexed Molecular Biology

NIST | Gaithersburg, Maryland | United States | about 7 hours ago

Open to U.S. citizens level Open to Postdoctoral applicants Stipend Base Stipend Travel Allotment Supplementation $82,764.00 $3,000.00

Microfluidics for Biotherapeutics Measurements

NIST | Gaithersburg, Maryland | United States | about 7 hours ago

, materials science, and engineering. key words Lab-on-a-chip; Microfluidics; Fluorescence; Photography; Biologic; Protein; Aggregation;Cells; biotherapeutics; Eligibility citizenship Open to U.S. citizens

Microfluidics and Lab-on-a-Chip Technologies for Controlled Molecular Self-Assembly, Analytical Biochemistry, and Multiplexed Measurements

NIST | Gaithersburg, Maryland | United States | about 7 hours ago

; Liposomes; Microfluidics; Nanoparticles; Nanotechnology; Reactions; Self-assembly; Separations; Protein therapeutics; Eligibility citizenship Open to U.S. citizens level Open to Postdoctoral applicants

Micro- and Nano-Optomechanical Systems

NIST | Gaithersburg, Maryland | United States | about 7 hours ago

; Micromechanical; Nanomechanical; Eligibility citizenship Open to U.S. citizens level Open to Postdoctoral applicants Stipend Base Stipend Travel Allotment Supplementation $82,764.00 $3,000.00

Metrology for Semiconductor Manufacturing

NIST | Gaithersburg, Maryland | United States | about 7 hours ago

manufacturing. key words EUV lithography; Holographic microscopy; Extreme ultraviolet radiation; EUV damage; Optical scatterometry; Semiconductor manufacturing; Eligibility citizenship Open to U.S. citizens level

Metrology for Needed Nuclear Structure and Radioactive Decay Data

NIST | Gaithersburg, Maryland | United States | about 7 hours ago

; Spectroscopy; Nuclear decay data; Nuclear physics; Eligibility citizenship Open to U.S. citizens level Open to Postdoctoral applicants Stipend Base Stipend Travel Allotment Supplementation $82,764.00 $3,000.00

Metrology for Faint Photonics

NIST | Boulder, Colorado | United States | about 7 hours ago

-edge sensor; Photonics; Single photon sources; Eligibility citizenship Open to U.S. citizens level Open to Postdoctoral applicants Stipend Base Stipend Travel Allotment Supplementation $82,764.00

DUV/EUV Nanoscopy for Characterization of Nanoscale Devices

NIST | Gaithersburg, Maryland | United States | 1 day ago

Microscopy; Defect Measurement; Dimensional Measurement Eligibility citizenship Open to U.S. citizens level Open to Postdoctoral applicants Stipend Base Stipend Travel Allotment Supplementation $82,764.00