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the “NIST-on-a-chip” program, we are designing and building chip-scale accelerometers as field-deployable SI-traceable standards. The accelerometers employ a micromechanical structure in conjunction with a
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to identify and explore deformation mechanisms and establish structure-property relationships for materials subjected to dynamic mechanical and thermal loading. key words Digital image correlation; Electrical
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. This system is being used to see how yield loci change with plastic strain level and with changes in multi-axial strain path. Opportunities exist to study structure-property relationships using electron
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energies determined by molecular composition, structure, and vibrational mode type. Various optical methods exist to record these vibrational spectra, enabling access to the rich chemical landscape within
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for the high-throughput simulation of adsorption isotherms in nanoporous solids. References Cockayne E, Wong-Ng W, Chen YS, Culp JT, Allen AJ: Density Functional Theory Study of the Structure of the Pillared
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Structural Systems Division opportunity location 50.73.11.B4445 Gaithersburg, MD NIST only participates in the February and August reviews. Advisers name email phone Li-Piin Sung lipiin@nist.gov 301.975.6737
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(particle stabilized) emulsions for particle-interface adhesion strength, MW characterization of extended or structured polymers for organic electronics in organic solvents, characterization of interfacial
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structure and the electronic response to external stimuli. We seek to understand nanoscale variations in conductivity by leveraging our existing capabilities in AFM-based microwave impedance microscopy (sMIM
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diagnostics of plasmas with an x-ray free electron laser. key words Atomic spectroscopy; Atomic structure; Highly-charged ions; Collisional-radiative modeling; Atomic collisions; Plasma spectroscopy; Atomic
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balance between the choices of mathematical approximation, computer architecture, data structures, and other factors-a balance crucial to the solution of many applications-driven problems. key words