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The expert will participate in the necessary methodological developments and analyses of airborne data recorded by the IAGOS research infrastructure (https://www.iagos.org ) and from other networks, to provide
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(based for instance on classical and/or ab initio molecular dynamics, combined with ONIOM-type QM/MM approaches) to gain deeper insight into the structure of the HFIP solvent, its coordination properties
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system housing the two arms of the PET-SCAN system - Develop a simulation tool to optimize the prototype structure - Develop software tools for data acquisition and processing This work is being carried
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techniques; Structural and functional characterization of interfaces and junctions, in particular through nanoscale analyses; Development, adaptation, and optimization of experimental methodologies
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Postdoctoral researcher (M/F). Modeling damage during earthquakes. Comparison with geophysical data.
(# ANR-22-CE01-0028) funded by the ANR. This two-year project (01/04/26 to 31/03/28) aims to explore the link between the dynamics of rupture on seismic faults and the structure of the damage zone
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Mohammed (Maurice Halbwachs Center, CNRS). This research project is structured around five axes: analysis of police and court records; sociology of the anti-drug police enforcement; analysis of the social
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the boundary layer and the turbines, but also at the center. This should shed some new light on the dissipative structures and extreme events possibly responsible for the large scale evolution of the flow
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, experimentation and modelling. The research aeras are structured through 4 main unifying themes: Interiors of the Earth and Planets, Natural Hazards, Earth System and Origins. The IPGP is in charge of labelled
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scientific imaging, as well as access to hyperspectral imaging equipment and to heritage collections studied within the laboratory's activities. Where to apply Website https://emploi.cnrs.fr/Offres/CDD/UAR3224
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• Participation in micro- and nanofabrication processes using CRHEA's state-of-the-art cleanroom facilities (advanced lithography and etching techniques) • Optical and structural characterization of fabricated