319 structures-"https:" "https:" "https:" "https:" "UCL" "UCL" "UCL" positions at CNRS
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diffraction) for structural analysis. - ICP-MS for elemental composition. - SEM/EDX and TEM for morphology and element distribution. - TGA/DTA for thermal analysis and stability. - XPS for surface chemical
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instrumentation. Where to apply Website https://emploi.cnrs.fr/Offres/CDD/UMR5214-JEAGAY-092/Default.aspx Requirements Research FieldPhysicsEducation LevelPhD or equivalent LanguagesFRENCHLevelBasic Research
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the absorption of other MGEs, thereby restricting gene flow due to altered capsule production. Where to apply Website https://emploi.cnrs.fr/Offres/CDD/UMR5100-OLAREN-007/Default.aspx Requirements Research
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al. 2019] and point-force Lagrangian models, with advanced post-processings [Vegad2024]. This work will be carried out with the YALES2 high-performance platform. Where to apply Website https
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the Universities of Salzburg and Maastricht. One position includes an additional computational component, and the other a focus on transcranial brain stimulation. Where to apply Website https
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scientific activities related to data production and structuration, carried out by project partners in the humanities and social sciences, particularly in heritage science, across various corpora and case
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different from that decrypted from the compressed stream. Where to apply Website https://emploi.cnrs.fr/Offres/Doctorant/UMR8506-STEDOU-020/Default.aspx Requirements Research FieldEngineeringEducation
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to apply Website https://emploi.cnrs.fr/Offres/Doctorant/UMR7261-AICBEL-047/Default.aspx Requirements Research FieldBiological sciencesEducation LevelPhD or equivalent Research FieldEnvironmental
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• Openness to interdisciplinary research (climate and social sciences) • Good level of scientific English Where to apply Website https://emploi.cnrs.fr/Offres/Doctorant/UAR636-ALERUB-040/Default.aspx
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Postdoctoral researcher (M/F), synthesis of crystal phase heterostructures by Molecular Beam Epitaxy
outcomes. Molecular beam epitaxy (MBE) growth of GaAs nanowires on patterned Si/SiO₂ substrates. Structural analysis by electron microscopy (in situ TEM, electron diffraction, zone-axis indexing). Automated