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the the Erich Schmid Institute of Materials Science of the Austrian Academy of Sciences (ÖAW) | Austria | about 1 month ago
Postdoc (f/m/x) (40 hours per week) with an emphasis on transmission electron microscopy (TEM) and Focused Ion Beam (Ga and Xe FIB) sample preparation. Academy Scientists (Post-docs) generally work to the
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businesses in their strategies. Do you want to know more about LIST? Check our website: https://www.list.lu/ How will you contribute? Describe the main responsibilities of the position. The position is placed
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SD-26065 -POST-DOC IN METHOD DEVELOPMENT FOR HIGH RESOLUTION CHARACTERIZATION OF NOVEL SAFE AND S...
in their decisions and businesses in their strategies. Do you want to know more about LIST? Check our website: https://www.list.lu/ How will you contribute? Describe the main responsibilities
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advanced expertise on the technologies studied in the project (which are commercial). Furthermore, the post-doc will indeed rely on the LAAS PROOF platform (https://www.laas.fr/projects/proof/ ) which
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variety of techniques, such as patch-clamp electrophysiology, FIB-SEM volume imaging, tissue clearing (iDISCO), and/or single-cell sequencing. The postdoctoral researcher will have the opportunity to: lead
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, chemical etching, or FIB milling is a strong advantage. Familiarity with optical setups for imaging or polarization-resolved analysis will be considered a significant plus. Responsibilities You will be part
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cultures Stable isotope labelling coupled to nanoSIMS Fluorescence microscopy & Expansion microscopy Cryo-FIB in tandem with Cryo-EM This position is financed by the Independent Research Fund Denmark
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this postdoctoral position, you will apply advanced electron microscopy techniques, including STEM and FIB, to investigate the structure and behavior of catalytic nanomaterials critical for green hydrogen and energy
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wires with high form factors 3) Apply KOH-based wet treatments to restore etched wire surfaces 4) Characterize processes morphologically (SEM, FIB-STEM, AFM) et optically (cathodoluminescence) 5
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three years prior to the application deadline*. Experience with advanced microscopy (for example transmission electron microscopy (TEM), focused ion beam/scanning electron microscopy (FIB/SEM), cryogenic