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of dislocation stress fields (in collaboration with CEA Saclay). - Program the diffraction procedures to generate images comparable to Electron Channeling Contrast Imaging (ECCI) obtained using a Scanning Electron
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Coherent Diffraction Imaging (BCDI), ptychography, and X-ray Photon Correlation Spectroscopy (XPCS). The goal is to move beyond simple correlations to discover the causal, governing rules of defect-property
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biology through single-crystal neutron diffraction techniques. This position focuses on visualizing critical hydrogen atoms in carbohydrate-binding proteins and their complexes using neutron diffraction
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Postdoctoral researcher (M/F), synthesis of crystal phase heterostructures by Molecular Beam Epitaxy
outcomes. Molecular beam epitaxy (MBE) growth of GaAs nanowires on patterned Si/SiO₂ substrates. Structural analysis by electron microscopy (in situ TEM, electron diffraction, zone-axis indexing). Automated
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data from the European XFEL facility at DESY. Project website: https://www.mpinat.mpg.de/628848/SM-Ultrafast-XRay-Diffraction Your profile Eligible candidates have strong skills in computational physics
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diffraction and if possible, X-ray imaging. We expect the candidate's enthusiasm for interdisciplinary work related to Space sciences. The working place will be Dübendorf / Zurich. Postdoc in "Development and
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such as the heart and nervous system, invariably with fatal consequences. The project will focus on probing the molecular factors underlying this instability (see for example https://www.nature.com/articles
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techniques, including atomic imaging of surfaces and bulk, nano-probe diffraction (4D-STEM), high-energy-resolution, and valence-level energy-loss spectroscopy, cryogenic microscopy, Lorentz microscopy and
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radiation beamline hands-on experience in X?ray microscopy techniques, X?ray diffraction or X?ray fluorescence working knowledge of image processing e.g. using machine learning German skills For further
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characterization of C and SiC fibers - Training on bench use (in particular heating techniques by Joule effect, laser diffraction, infrared imaging, pyrometry, preparation of micrometric samples, ...) - Technical