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related field Demonstrated experience with scanning/transmission electron microscopy (S/TEM) and/or diffraction (Lorentz S/TEM experience is a plus) Strong foundation in electronics and devices, including
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perform advanced synchrotron experiments to probe structural, chemical, and dynamic evolution of defects in thin films and heterostructures. Utilize techniques such as Bragg coherent diffraction imaging
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Diffraction (XRD) and Rietveld refinement for phase analysis. Electron microscopy (SEM, TEM, EDS) for morphology and elemental distribution. Spectroscopic techniques (XPS, Raman, FTIR) for surface chemistry
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crystals using either electron or X-ray diffraction techniques. While candidates with experience in structure analysis based on powder diffraction, neutron diffraction, or scattering data will also be
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, mass spectrometry, X-ray diffraction, X-ray photoelectron spectroscopy, vibrational spectroscopy, and electron microscopy. Documented experience in photophysical characterization, including UV–Vis
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measurement Experience in x-ray diffraction techniques Experience designing and building experimental control and data acquisition systems Ability to model Argonne’s core values of impact, safety, respect
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such as X-ray diffraction (XRD), X-ray fluorescence (XRF), ICP-OES, Scanning Electron Microscopy (SEM), and Mineral Liberation Analysis (MLA). Conduct research on coarse particle separation, including
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materials characterization including x-ray diffraction, atomic force microscopy and transmission electron microscopy. Furthermore, you will have access to extensive device fabrication capabilities, and a
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and knowledge considered as assets: working experience at a synchrotron radiation beamline hands-on experience in X?ray microscopy techniques, X?ray diffraction or X?ray fluorescence working knowledge
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their nickel complexes, using Schlenk techniques, the glovebox, NMR spectroscopy, mass spectrometry, single-crystal X-ray diffraction and other techniques that might be deemed suitable. You will then test