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radiation beamline hands-on experience in X?ray microscopy techniques, X?ray diffraction or X?ray fluorescence working knowledge of image processing e.g. using machine learning German skills For further
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: experience in neutron and X-ray single-crystal diffraction techniques (data collection, data reduction/structural refinement) and knowledge of programming languages, such as Python, would be desirable. Each
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, including X-Ray diffraction, scanning electron microscope, atomic force microscopy Additional comments NA Website for additional job details https://emploi.cnrs.fr/Offres/CDD/UMR137-JULGRO0-024/Default.aspx
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controlled atmosphere - master the usual characterisations of materials (X-ray diffraction, spectroscopies) - have knowledge of magnetism - fluency in English (oral and written comprehension and expression
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main contributor to the In-situ X-ray diffraction experiments performed for studying the formation of new silicides using both large volume presses such as multi-anvil and Paris-Edinburgh Presses
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particularly valuable. Documented experience in materials characterization, such as NMR spectroscopy, mass spectrometry, X-ray diffraction, X-ray photoelectron spectroscopy, vibrational spectroscopy, and
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hydrothermal methods. Structural and Chemical Characterization using: X-ray Powder Diffraction (XRD) and Rietveld refinement for phase analysis. Electron microscopy (SEM, TEM, EDS) for morphology and elemental
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characterization techniques such as scanning electron microscopy (SEM, HRTEM), X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS) and chemisorption techniques (TPD, TPR) is needed. Your contribution
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completed in a relevant field of study. Knowledge of x-ray/optical/electron physics, including diffraction, optics, detectors, scattering etc. Experience with deep learning (DL) libraries such as Tensorflow
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communication skills, as well as oral presentation skills Preferences Experience in synthetic inorganic chemistry. Characterization of paramagnetic compounds. Familiar with single-crystal X-ray diffraction and