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(TEM) investigation of van der Waals materials - Optical spectroscopy of van der Waals materials ※ Important: The deadline is 18:00 in KST time, 7th November 2025 ※ Detailed recruitment page: https
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diamond-anvil cell laboratory, a large-volume press laboratory (piston-cylinder, Paris-Edinburgh presses, multi-anvil press), a femtosecond laser micro-machining facility, electron microscopes (SEM, TEM
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-situ structural analyses (TEM, synchrotron XRD), and device-level demonstrations of ferroelectric HEMTs. The candidate will carry out electrical characterizations on ScAlN-based structures developed
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oxide NPs, magnetic clusters, nanocomposites); Experience with physicochemical characterisation technologies (i.e., DLS, zeta-potential, UV-VIS, FTIR, TEM, SEM, ICP, TGA, HPLC, VSM, SQUID, XRD, XPS, MRI
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diseases. Our laboratory is equipped with state-of-the-art instrumentation for the proposed studies and have generous access to a Titan Krios G3i Cryo-TEM equipped with a K3 direct electron detector, imaging
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; • Electron microscopies (Transmission Electron Microscopy – TEM and Scanning Electron Microscopy – SEM) for morphological and structural studies; • X-ray photoelectron spectroscopy (XPS) for surface chemistry
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advanced electrode materials for aqueous battery applications, and employ various physical characterization techniques (XRD, SEM/TEM, XPS) to investigate their structure and properties. Develop and optimize
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-on experience in: Additive manufacturing of High Entropy alloys and Al-based alloys Powder characterization – Microstructure characterization (SEM, EBSD, TEM, XRD) Mechanical testing (tensile, fatigue, creep
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Jerzy Haber Institute of Catalysis and Surface Chemistry, Polish Academy of Sciences | Poland | about 1 month ago
in experimental studies on the characteristics of the structure of functional layers (among others AFM, TEM, SEM, SPR, QCM-D, EIS, CV) (0-10 points). The minimum required: 3. Knowledge of programming
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, Nature Materials, 12, 426 (2013). (http://dx.doi.org/10.1038/NMAT3581 ) 2 - U. Kumar, G. Colas des Francs, A. Bouhelier, E. Dujardin, et al. ACS Photonics, 5, 2328-2335 (2018). (https://doi.org/10.1021