71 structural-engineering-"https:"-"https:"-"https:"-"FEMTO-ST" Postdoctoral positions at Argonne
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apply funding from federal agencies (e.g., the Department of Energy and National Science Foundation). A successful candidate should have a solid background in power system engineering, optimization
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, you will: Apply engineering principles to develop molten salt synthesis and separations processes to support fuel cycle science and technology. Develop and test new electrodes for use in molten salt
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harness the nonequilibrium correlation between structural, charge, and spin/pseudospin degrees of freedom in two-dimensional (2D) materials. The success of this program will lead to new means to control
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, the postdoc will translate demonstrated prototype performance into a complete, buildable engineering specifications package for a scaled multi-element analyzer spectrometer and associated microscope/imaging
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The Argonne Leadership Computing Facility’s (ALCF) mission is to accelerate major scientific discoveries and engineering breakthroughs for humanity by designing and providing world-leading computing
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, engineering, computational science, a physical science (materials science, chemistry, physics etc.), or related field. Hands-on experience with AI frameworks and employing large language models. Strong Python
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Position Requirements Recent or soon-to-be-completed PhD (within the last 0-5 years) in field of Chemistry, Chemical Engineering, Mechanical Engineering, Materials Science, Electrochemistry, or a related
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structural models and compute electronic and vibrational properties. Develop and train neural-network or other machine-learned interatomic potentials to enable large-scale molecular dynamics (MD) simulations
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will be working with ALCF’s technical teams (e.g., AI/ML, Data Science, Performance Engineering) and will focus on collaborative APEX research projects. We are looking to hire four Postdoctoral
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optimize epitaxial growth of complex oxide nanostructures, especially ferroelectrics, via solid-phase epitaxy (SPE) Perform thin-film and device characterization across structural (XRD, AFM, SEM, XPS, TEM