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Field
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microscopy, particle size and surface area analysis, density measurements, and X-ray diffraction. In-situ techniques such as thermogravimetric analysis and dilatometry will be applied, complemented by
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in any of the following methods will be advantageous: Single-crystal crystallography, Powder X-ray diffraction, NMR, UV-vis, IR and Luminescence spectroscopy, electrochemistry. The candidate will hold
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such as X-ray diffraction (XRD) to characterize, at the molecular level, smectite samples from various Swedish mineral deposits. The PhD student will develop, apply, and combine theoretical molecular
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. The PhD student will develop, apply, and combine theoretical molecular dynamics (MD) simulations with experimental techniques such as X-ray diffraction (XRD) to characterize, at the molecular level
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such as X-ray diffraction (XRD) to characterize, at the molecular level, smectite samples from various Swedish mineral deposits. The PhD student will develop, apply, and combine theoretical molecular
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PhD position on ID14: Linking Elasticity of (Mg₁₋ₓFeₓ)O to Seismic Anomalies in Earth’s Lower Mantle
Experience in high-pressure, solid-state physics, nuclear resonance scattering, x-ray diffraction, and/or other synchrotron techniques is desirable but not required Proficiency in English (working language at
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morphological characterization will be carried out using electron microscopy, X-ray diffraction, and IR spectroscopy, to establish correlations between structure and performance. The formulations developed and
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analysis of scanning electron microscopy, electron backscatter diffraction, and energy dispersive spectroscopy. Skilled in the interpretation and analysis of transmission electron microscopy and X-ray
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synchrotron techniques such as X-ray photoelectron, absorption and fluorescence spectroscopies, and X-ray diffraction will be used for real-time analysis. Measurements will be conducted in controlled
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for electrocatalysis or lithium insertion. Structural investigation will allow us to determine average crystal structure with use of X-ray diffraction (powder or single crystal), small-angle scattering to determine