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being delivered to the end-users as a so-called Radioactive Ion Beam (RIB). Successful operating facilities, like ISOLDE at CERN and ISAC at TRIUMF, can produce up to about 1000 different RIBs from up
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Development of a Low-Voltage Multi-Beam SEM for High-Throughput Imaging | TU Delft Job description Scanning Electron Microscopy (SEM) plays a central role in today’s nanoscale imaging across both science and
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measure the extent of silicon phase transformation and plasticity underneath a silicon micro-scratch, using electron backscatter diffraction or transmission Kikuchi diffraction on focused ion beam lift-outs
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microscopy (EM) method development using focused ion beam (FIB), cryo-EM and electron tomography. The position is for four years of doctoral studies, including participation in research and postgraduate
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ion beam (FIB), cryo-EM and electron tomography. The position is for four years of doctoral studies, including participation in research and postgraduate courses. The last day to apply is 12 November