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to reduce the stack pressure required for cycling using functional interlayers. You will use techniques such as EIS, solid-state NMR, FIB-SEM, and various electrochemical methods to characterize materials and
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characterization using cryo-electron tomography (cryo-ET), and complementary light microscopy methods. Specific objectives are: Setting up cryo-ET FIB SEM workflow for reconstituted synapses Visualize nanoscale
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microscopy (EM) method development using focused ion beam (FIB), cryo-EM and electron tomography. The position is for four years of doctoral studies, including participation in research and postgraduate
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ion beam (FIB), cryo-EM and electron tomography. The position is for four years of doctoral studies, including participation in research and postgraduate courses. The last day to apply is 12 November