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of Operating Microelectronic Devices by X-ray Diffraction Microscopy Beamline ID01, at the ESRF is a world leading instrument dedicated to micro- and nano-beam X-ray diffraction imaging experiments. It enables
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paramagnetic resonance (EPR), or magnetic resonance imaging (MRI) Familiarity with analytical tools: X-ray diffraction (XRD), scanning electron microscopy (SEM), X-ray computed tomography (XRCT) Expertise in
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DTU Tenure Track Researcher on Nanoreactors for Operando Visualizations of Nanoparticle Catalysis...
experience with TEM techniques including aberration-corrected high-resolution imaging, diffraction, ETEM, EFTEM and EELS. It is critical, that you have command of these TEM techniques under the lowest possible
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the 2025 Nobel Prize in Chemistry. Electron microscopy and electron diffraction offer powerful tools for advanced structural characterization. Aberration correction now enables imaging with true atomic
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measure the extent of silicon phase transformation and plasticity underneath a silicon micro-scratch, using electron backscatter diffraction or transmission Kikuchi diffraction on focused ion beam lift-outs
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the fields of nanoelectrochemistry, electrochemical imaging, kinetics and mechanisms, hydrodynamic techniques, spectroscopy, microscopy (AFM and STEM), programming, data analysis, and multiphysics modelling
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of experts in material synthesis, electrical characterization, device simulations, high-resolution imaging and synchrotron research. The division has own laboratories in the Ångström clean-room lab