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contact and thus minimize friction and damage to the surfaces for improved energy efficiency [5,6]. To characterize these different polymer brushes, atomic force microscopy (AFM) is used, which in its
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conjunction with imaging techniques (TEM, SEM, and AFM). This research project falls within CERMAV's key research areas and is being carried out within the “Self-assembly and Physicochemistry of Glycopolymers
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, public authorities in their decisions and businesses in their strategies. Do you want to know more about LIST? Check our website: https://www.list.lu/ How will you contribute? You will pioneer
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, AFM, XRD, eCV, Hall, Nomarski, low- and room-temperature PL). Successful applicants will gain expertise in compound semiconductor epitaxy, advanced characterisation and will combine this with
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/ Partnerships Partners of the PEPR DIADEM – CINEMA project funding this PhD: IRCER, Institut P’, ILM https://www.pepr-diadem.fr/projet/cinema-2/ Scientific Field and Context The optimization of growth–property
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materials characterization (e.g., UV-Vis-NIR, FTIR, XRD, SEM, AFM, Profilometer); Ability to work in a multidisciplinary team in an international environment and to work autonomously; Experience in providing
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fabrication. Receive individual trainings in state-of-the-art methodology, comprising pulsed laser deposition (PLD), atomic force microscopy (AFM), advanced X-ray diffraction (XRD), and transport measurements
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& Molecular System group employs single-molecule techniques, AFM and optical tweezers, to study the operation of small synthetic molecules and biomolecules. Our expertise covers the development of single
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crystals in real time using the technique of atomic force microscopy (AFM). We are the first group to use this approach to determine the nanoscale flexing transformation mechanism of a MOF induced by solvent
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) The subject of the PhD Thesis will be studying polarons in real space by noncontact atomic force microscopy (nc-AFM), focusing on their thermally-, field- and light-induced motion. Further, the growth