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using atomic force microscopy (AFM), Raman spectroscopy, X-ray diffraction, X-ray photoemission spectroscopy (XPS) and Rutherford backscattering spectroscopy (RBS), • the transfer of 2D materials and van
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diffraction (XRD), profilometry, and spectroscopic ellipsometry, complemented by optoelectronic characterization of the fabricated devices. Overall, the project supports IEMN research on light-emission
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